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[M] シリコン結晶欠陥の基礎物性とその評価法 Basic Properties of Defects in Silicon and Their Characterizing Techniques Volume


Creator: Publisher: リアライズ社 (Date of publication: 1997)

Form: Volume Volume
Language: Japanese
Physical description: 192p; 30cm
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Identifier: ISBN: 9784947655974
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Item identifier Library Shelf Call number Circulation status
529620 Namiki Books 16 Picture 621.382|U|05573 Available On Shelf