Showing Manifestation
[M] シリコン結晶欠陥の基礎物性とその評価法 Basic Properties of Defects in Silicon and Their Characterizing Techniques
Creator: 上浦 洋一 Publisher: リアライズ社
(Date of publication: 1997)
Form: | Volume |
Language: | Japanese |
Physical description: | 192p; 30cm |
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Identifier: | ISBN: 9784947655974 |
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