[M] Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society

Creator: edited by Benjamin M. Siegel, Donald R. Beaman Contributor: edited by Benjamin M. Siegel, Donald R. Beaman Publisher: John Wiley & Sons (Date of publication: 1975)

• Detail

Form:	Volume
Language:	English
Physical description:	474p; 27cm
Subject:
Classification:	UDC: 621.385.833
Tag:
Identifier:	ISBN: 9780471790204
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
205664	Sengen	Books 11	621.385.833|S|5820	Available On Shelf

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