資料の表示
[M]
Physical aspects of electron microscopy and microbeam analysis 
edited by Benjamin M. Siegel and D. R. Beaman
著者: Siegel, Benjamin M. Electron Microscopy Society of America Beaman, Donald Robert Microbeam Analysis Society 協力者・編者: edited by Benjamin M. Siegel, Donald R. Beaman 出版者: Wiley (出版日: 1975)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xiii, 474 p. ; 26 cm |
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ISBN: 9780471790204
NCID: BA07555186
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| 注記: |
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973//"A Wiley biomedical-health publication."//Includes bibliographical references and index |
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