出版者:
American Institute of Physics
| 代替タイトル |
J. vac. sci. technol., B, Microelectronics process. phenom//Journal of vacuum science & technology. B, Microelectronics processing and phenomena//Journal of vacuum science and technology. B, Microelectronics processing and phenomena//Microelectronics processing and phenomena |
| ISSN |
0734211X
|
| NCID |
AA10635106
|
| 所蔵情報 |
【並木】<年次:1983-1990>Vol.1-8
|
| 注記 |
【配架場所】並木 集密書庫27
継続前誌:Journal of vacuum science and technology
継続後誌:Journal of vacuum science & technology. Second series. B, Microelectronics and nanometer structures, processing, measurement and phenomena |
| 1 |
Journal of Vacuum Science & Technology B Vol.31 No.1-3

(2013)
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| 2 |
Journal of Vacuum Science & Technology B Vol.31 No.4-6

(2013)
|
| 3 |
Journal of Vacuum Science & Technology B Vol.30 No.1-3

(2012)
|
| 4 |
Journal of Vacuum Science & Technology B Vol.30 No.4-6

(2012)
|
| 5 |
Journal of vacuum science & technology. Second series. B, Microelectronics and nanometer structures, processing, measurement and phenomena 29 1-3

(2011)
|
| 6 |
Journal of vacuum science & technology. Second series. B, Microelectronics and nanometer structures, processing, measurement and phenomena 29 4-6

(2011)
|
| 7 |
Journal of Vacuum Science & Technology B Vol.28 No.4-6

(2010)
|
| 8 |
Journal of Vacuum Science & Technology B Vol.28 No.1-3

(2010)
|
| 9 |
Journal of Vacuum Science & Technology. Second series. B, Microelectronics and Nanometer Structures, Processing, Measurement and Phenomena 27(1-2)

|
| 10 |
Journal of Vacuum Science & Technology. Second series. B, Microelectronics and Nanometer Structures, Processing, Measurement and Phenomena 27(3-5)

|