日本語

Search Resource

Advanced search

36 records found from 104202 records in 0.070 seconds.

Sort by: Date of acquisition Date of publication Title

31 SEM microcharacterization of semiconductors Volume
Item identifier Library Shelf Call number Circulation status
216176 Namiki Books 18 Picture 548.73|Ｈ|T-1311 Available On Shelf
32 Elements of X-Ray diffraction Volume
Item identifier Library Shelf Call number Circulation status
209076 Namiki Books 18 Picture 548.73|C|3832 Available On Shelf
33 High resolution X-ray diffractometry and topography Volume
Item identifier Library Shelf Call number Circulation status
217806 Namiki Books 18 Picture 548.73|Ｂ| Available On Shelf
34 Applications of X-ray topographic methods to materials science Volume
Item identifier Library Shelf Call number Circulation status
215670 Namiki Books 18 Picture 548.73|W|T-985 Available On Shelf
35 Crystallographic data on metal and alloy structures Volume
Item identifier Library Shelf Call number Circulation status
208024 Namiki Books 18 Picture 548.73|T|545 Available On Shelf
36 The interpretation of X-ray diffraction photographs Volume
Item identifier Library Shelf Call number Circulation status
209692 Namiki Books 18 Picture 548.73|H|2136 Available On Shelf

:
Advanced search