[M] Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

著者: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography 出版者: ASTM (出版日: 1964)

資料: Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

本棚: 書庫12 (千現)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: STP|A|1607

原簿番号:

所蔵情報ID: 202064

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1967年08月09日

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受入時刻:

作成時刻: 2010/12/15 22:47:54

更新時刻: 2025/12/23 15:15:39