Search Resource

Advanced search

68 records found from 103570 records in 0.036 seconds.

Sort by: Date of acquisition Date of publication Title

1 Diffusion and Defect Data Pt A : Defect and Diffusion Forum Serial Volume
ISSN: 16629507
Holding information: 【千現】<年次:1988-2009>Vol.57-212,249-286
2 Beam Injection Assessment of Defects in Semiconductors : Proceedings of The 5th International Workshop (BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August・September 1998 Vols.63-64 Vols.63-64 Volume
Item identifier Library Shelf Call number Circulation status
217984 Sengen Books 9 Picture 548.526|D|10776 Available On Shelf
3 Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79 Volume
Item identifier Library Shelf Call number Circulation status
218799 Sengen Books 9 Picture 548.526|D|11471 Available On Shelf
4 Contemporary Studies in Condensed Matter Physics : Proceedings of The Symposium on Condensed Matter Physics ( SFKM'97 ), Kladovo, Yugoslavia, 29 Sept.-1 Oct. 1997 Vol.61-62 Vol.61-62 Volume
Item identifier Library Shelf Call number Circulation status
217873 Sengen Books 9 Picture 548.526|D|10674 Available On Shelf
5 Defect Interaction and Clustering in Semiconductors Vols.85-86 Vols.85-86 Volume
Item identifier Library Shelf Call number Circulation status
219336 Sengen Books 9 Picture 548.526|D|11789 Available On Shelf
6 Defects and Diffusion in Ceramics : An Annual Retrospective 1 Vol.164 Volume
Item identifier Library Shelf Call number Circulation status
217923 Sengen Books 8 Picture 548.526|D|10716 Available On Shelf
7 Defects and Diffusion in Semiconductors : An Annual Retrospective Vols.162-163 Volume
Item identifier Library Shelf Call number Circulation status
217895 Sengen Books 8 Picture 548.526|D|10689 Available On Shelf
8 Defects in Semiconductors Ⅰ NCDS -1: Proceedings of The 1st National Conference on Defects in Semiconductors, held in St.Petersburg, Russia, April 26-30, 1992 Volume
Item identifier Library Shelf Call number Circulation status
216465 Sengen Books 3 Picture 537.311|B|T-1530 Available On Shelf
9 Diffusion & Defect Data Pt.B Vol.34 Volume
Item identifier Library Shelf Call number Circulation status
216446 Sengen Books 8 Picture 548.526|D| Available On Shelf
10 Diffusion & Defect Data pt.A Vol.99-100 Volume
Item identifier Library Shelf Call number Circulation status
216430 Sengen Books 8 Picture 548.526|| Available On Shelf

:
Advanced search