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17 records found from 103568 records in 0.040 seconds.

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1 Semiconductor material and device characterization Volume
Item identifier Library Shelf Call number Circulation status
602719 Sengen Books 11 Picture 621.315.592|S| Available On Shelf
2 Proceedings of the Yamada Conference LIV The 9th International Conference on Shallow- Level Centers in Semiconductors: SLCS-9 held in Awaji Island, Hyogo, Japan 24-27 September 2000 SLCS-9 Volume
Item identifier Library Shelf Call number Circulation status
211080 Sengen Books 11 Picture 621.315.592|S|ｷ 1598 Available On Shelf
3 Defects in Semiconductors ICDS-19 Part 3: Proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 Part 3 Volume
Item identifier Library Shelf Call number Circulation status
211069 Sengen Books 11 Picture 621.315.592|D|ｷ 1587 Available On Shelf
4 Defects in Semiconductors ICDS-19 Part 2: Proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 Part 2 Volume
Item identifier Library Shelf Call number Circulation status
211068 Sengen Books 11 Picture 621.315.592|D|ｷ 1586 Available On Shelf
5 Defects in Semiconductors ICDS-19 Part 1: Proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 Part 1 Volume
Item identifier Library Shelf Call number Circulation status
211067 Sengen Books 11 Picture 621.315.592|D|ｷ 1585 Available On Shelf
6 23rd International Conference on the Physics of Semiconductors Abstracts; ⅩⅩⅢICPS 1996 Berlin, Germany, Technische Univesitat Berlin July 21-26, 1996 Volume
Item identifier Library Shelf Call number Circulation status
219279 Sengen Books 11 Picture 621.315.||ｷ1193 Available On Shelf
7 Proceedings of the 18th International Conference Defects in Semiconductors Part 4; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 4 18 Volume
Item identifier Library Shelf Call number Circulation status
219286 Sengen Books 11 Picture 621.315.|D|ｷ1200 Available On Shelf
8 Proceedings of the 18th International conference Defects in Semiconductors Part 3; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 3 18 Volume
Item identifier Library Shelf Call number Circulation status
219285 Sengen Books 11 Picture 621.315.|D|ｷ1199 Available On Shelf
9 Proceedings of the 18th International Conference on Defects in Semiconductors Part 1; ICDS-18 Sendai, Japan, July 23-28, 1995 Part1 18 Volume
Item identifier Library Shelf Call number Circulation status
219283 Sengen Books 11 Picture 621.315.|D|ｷ1197 Available On Shelf
10 Proceedings of the 18th International Conference on Defects in Semiconductors Part 2; ICDS 18 Sendai, Japan, July 23-28, 1995 Part 2 18 Volume
Item identifier Library Shelf Call number Circulation status
219284 Sengen Books 11 Picture 621.315.|D|ｷ1198 Available On Shelf

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