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[M] Diffusion and defect data. Pt. B, Solid state phenomena Serial Volume

Trans Tech S.A
Publisher: Trans Tech Pub.

Titlte alternative Diffus. defect data, Solid state data, Pt. B Solid state//Diffusion and defect data. Solid state data. Pt. B, Solid state phenomena
ISSN 10120394
NCID AA10691162
Holding information

【並木】＜年次:1988-2002＞Vol.1-88

Note

【配架場所】並木 集密書庫8
継続前誌：Diffusion and defect data

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1 Defect Interaction and Clustering in Semiconductors Vols.85-86 Vols.85-86 Volume
Item identifier Library Shelf Call number Circulation status
219336 Namiki Journal Archives 8 Picture 548.526|D|11789 Available On Shelf
2 Gettering and Defect Engineering in Semiconductor Technology GADEST 2001 : Proceedings of the 9th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, S. Tecla, Italy September 30-October 3, 2001 Vols. 82-84 Vols.82-84 Volume
Item identifier Library Shelf Call number Circulation status
219032 Namiki Journal Archives 8 Picture 548.526|D|11571 Available On Shelf
3 Local Lattice Rotations and Dislinations in Microstructures of Distorted Crystalline Materials Vol. 87 Vol.87 Volume
Item identifier Library Shelf Call number Circulation status
219337 Namiki Journal Archives 8 Picture 548.526|D|11790 Available On Shelf
4 Ultra clean processing of silicon surfaces 2000 : proceedings of the Fifth International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000), held in Ostend, Belgium, September 18-20, 2000 Volume
Item identifier Library Shelf Call number Circulation status
218743 Namiki Journal Archives 8 Picture 548.526|D|11420 Available On Shelf
5 Polycrystalline semiconductors VI : materials, technologies, and large area electronics : proceedings of the sixth International Conference, Saint Malo, September 3-7, 2000 Volume
Item identifier Library Shelf Call number Circulation status
218998 Namiki Journal Archives 8 Picture 548.526|D|11538 Available On Shelf
6 Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79 Volume
Item identifier Library Shelf Call number Circulation status
218799 Namiki Journal Archives 8 Picture 548.526|D|11471 Available On Shelf
7 Special Defects in Semiconducting Materials Vol.71 Vol.71 Volume
Item identifier Library Shelf Call number Circulation status
218373 Namiki Journal Archives 8 Picture 548.526|D|11107 Available On Shelf
8 Diffusion and reactions : proceedings of the 2nd International Conference, held in Zakopane, Poland, Sept. 14-18, 1999 Volume
Item identifier Library Shelf Call number Circulation status
218393 Namiki Journal Archives 8 Picture 548.526|D|11127 Available On Shelf
9 Polycrystalline semiconductors V : bulk materials, thin films and devices : proceedings of the Fifth International Conference, held in Schwäbisch Gmünd, Germany, September 13-18, 1998 Volume
Item identifier Library Shelf Call number Circulation status
218036 Namiki Journal Archives 8 Picture 548.526|D|10808 Available On Shelf
10 Ultra clean processing of silicon surfaces : proceedings of the Fourth International Symposium on ultra clean processing of silicon surfaces held in Ostend, Belgium, September 21-23, 1998 Volume
Item identifier Library Shelf Call number Circulation status
218003 Namiki Journal Archives 8 Picture 548.526|D|10794 Available On Shelf

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