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18 records found from 103568 records in 0.040 seconds.

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1 次世代ＵＬＳＩ多層配線の新素材・プロセス技術 Volume
Item identifier Library Shelf Call number Circulation status
218846 Sengen Books 11 Picture 621.382|Y|11481 Available On Shelf
2 シリコン結晶欠陥の基礎物性とその評価法 Basic Properties of Defects in Silicon and Their Characterizing Techniques Volume
Item identifier Library Shelf Call number Circulation status
529620 Namiki Books 16 Picture 621.382|U|05573 Available On Shelf
3 半導体デバイス界面の汚染・損傷の評価と対策 Volume
Item identifier Library Shelf Call number Circulation status
529619 Namiki Books 16 Picture 621.382|k|05572 Available On Shelf
4 Fundamentals of solid state electronics Volume
Item identifier Library Shelf Call number Circulation status
602833 Namiki Books 16 Picture 621.382|S| Available On Shelf
5 半導体デバイス工程評価技術 ライフタイム、DLTS評価を中心として Volume
Item identifier Library Shelf Call number Circulation status
529622 Namiki Books 16 Picture 621.382|U|05575 Available On Shelf
6 超高速MOSデバイス 2 ２ Volume
Item identifier Library Shelf Call number Circulation status
216708 Sengen Books 11 Picture 621.382|C|8015 Available On Shelf
7 超高速ジョセフソン・デバイス ４巻 ４ Volume
Item identifier Library Shelf Call number Circulation status
207480 Sengen Books 11 Picture 621.382|C|8002 Available On Shelf
8 超高速バイポーラ・デバイス 1 １ Volume
Item identifier Library Shelf Call number Circulation status
204468 Sengen Books 11 Picture 621.382|C|8014 Available On Shelf
9 半導体 : 先端技術を支える Volume
Item identifier Library Shelf Call number Circulation status
602567 Namiki Books 16 Picture 621.382|S| Available On Shelf
10 クライオエレクトロニクス入門 Volume
Item identifier Library Shelf Call number Circulation status
527874 Namiki Books 16 Picture 621.382|N|04295 Available On Shelf

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